Scholarly record

A SYNTETHIC SEISMIC REFLECTION DATA, PROCESSED WITH NEW METHOD; COMMON REFLECTION SURFACE STACK

M. Soleimani, I. Piruz

Abstract

A standard imaging method in seismic data processing is the simulation of a zero offset section from seismic reflection data. In traditional imaging methods, e. g. NMO/DMO/stack, an accurate macro velocity model is needed. Common reflection surface (CRS) stack is a new data driven method, introduced in recent years which remove the necessity of making this model and just use the surface velocity to simulate zero offset section (2D) or volume (3D). In this article, we drive the CRS stacking on a synthetic data to obtain zero offset section with high signal-to-noise (S/N) ratio. With CRS stack, we make use of redundancy of seismic multi coverage data to do this. At the same time, the processes extracts travel time information from the data in the form of a number of so called kinematic wave field attributes assigned to each considered zero offset sample. These parameters are normal wave, normal incidence point (NIP) wave and incidence angle. In this way, we defined the stacking surfaces that fit best to actual events in the multi coverage data set by means of coherency analysis. So a coherency section and a section of each of three attributes obtained which define the stacking operator. Optionally, a subsequent optimization algorithm performed to refine these parameters. At the end, we observe an increased S/N ratio and an improved continuity along the events in the zero offset section, without loss of lateral resolution.

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