Scholarly record

GEOSTATISTICAL DISTRIBUTION OF LEAD AND ZINC METALS IN ARTANA 1 LANDFILL: MINERALOGICAL CHARACTERIZATION OF THE LANDFILL OBTAINED FROM RESIDUES FROM THE LEAD-ZINC FLOTATION PROCESS

Berat Sinani, Fisnk Frangu, Ramiz Krasniqi, Besnik Shala, Bahri Sinani, Vehbi Berisha

Abstract

The surface area of the studied area in the Artana 1 landfill is about 24,000 m2. Presented here are samples taken from 11 boreholes with survey designations S-6, S-8, S-9, S-11, S-12, S-16, S-19, S-20, S-24, B /Y-2 (S-Y-2), Y-5 (S-Y-5). Drilling wascarried out using the spiral survey method up to the base level of the soil. The workswere carried out by the Trepca-Karova institutions within the project of recycling wastefrom the ore flotation of the Artana-Kishnica mines. Samples were taken at each meter,the survey number separately and by meter were counted and bagged and prepared forseparation and reduction of samples by survey. The depth of soundings taken was asfollows for sounding S-6 (10.5m); S-8 (10m); S-9 (9m); S-11 (12.5m); S-12 (9.6m); S-16 (15.5m); S-19 (13.5m); S-20 (10m); S-24 (9m); B/Y-2 (S-Y-2) (18m); Y-5 (S-Y-5)(12m). The average value of lead, zinc based on the metric volume (titrimetric) analysis in these samples resulted in 4,463.60mg/kg Pb (~0.45%); 9,900.00mg/kg Zn (~0.99%); 1,263.64mg/kg PbO (~0.13%) and 1,600.00mg/kg ZnO (~0.16%), while based on X-ray diffraction (XRD) results, from the 11 samples analyzed so far (samples taken at Artana landfill 1), the analyzed samples contain the mineral Pyrite FeS2; Quartz mineral SiO2; the mineral Hydronijumjaros H7.95 Fe3 K0.35 O14.65 S2 as well as the gypsum mineral CaSO4x2H2O. Analyzing the sample with SEM-EDS on the surface, identifies the chemical elements O, Mg, Al, Si, S, K, Ca, Mn, Fe, Zn, As, while the analysis of the chemical composition at the point of a mineral also reveals the presence of the metal Pb. The instruments used (besides the volumetric analysis for the quantitative determination of Pb, Zn and their oxides) for mineralogical and geochemical analysis, X-ray diffraction (XRD), as well as scanning electron microscopy (SEM-EDS).

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