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EFFECTIVE ACCOUNTING FOR VERTICAL REFRACTION IN EDM LEVELING

Olga Vshivkova, Igor Kalugi

First published: 2021-12-20https://doi.org/10.5593/sgem2021/2.1/s09.56View metrics

Abstract

The instrumental accuracy of modern electronic tacheometers allows to measure the elevation difference with the accuracy of geometric leveling. Meanwhile EDM leveling is less time-consuming. The measurement accuracy comparable to the instrumental one is unattainable in real atmosphere due to the vertical refraction. At a distance of 1 km, the vertical refraction effect can reach several tens of centimeters. The decrease in the accuracy of trigonometric leveling due to the influence of vertical refraction limits the fields of its application. To account for vertical refraction a standard refraction coefficient of 0.13 is used in the software of total stations. The real range of values of the refraction coefficient is from -6 to +6. We have developed a technology to take into account the effect of vertical refraction. This technology allows to determine the refraction angle with an accuracy close to the angular accuracy of the used total station. We use the results of complex gradient meteorological and geodetic measurements to model the vertical refraction. At present time we work on creating of software-hardware complex for precise EDM leveling based on our technology. This complex includes equipment for rational organization of meteorological measurements and software. The software implements the original approach for the refraction correction calculating. The experiments have showed that corrected elevation differences accuracy is two orders of magnitude better than the measured ones. The being developed complex is intended to perform precise EDM leveling wherever it is necessary to quickly and exactly determine the elevation differences.

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Publication details

Title
EFFECTIVE ACCOUNTING FOR VERTICAL REFRACTION IN EDM LEVELING
Authors
Olga Vshivkova, Igor Kalugi
Proceedings
SGEM International Multidisciplinary Scientific GeoConference EXPO Proceedings; 21st SGEM International Multidisciplinary Scientific GeoConference Proceedings 2021, Informatics, Geoinformatics and Remote Sensing
Publisher
STEF92 Technology
Year
2021
Pages
451-458
SWS Citekey
Vshivkova20219451458
ISSN
1314-2704
ISBN
978-619-7603-62-0
Language
en
Publication type
Conference Paper
Keywords
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